Summary
Methods to measure the polarization of x rays from highly charged heavy ions with a significantly higher accuracy than that of the existing technology are needed to explore relativistic and quantum electrodynamics effects, including the Breit interaction. We developed an Electron Beam Ion Trap Compton Camera (EBIT-CC), a new Compton polarimeter with pixelated multi-layer silicon, and cadmium telluride counters. The EBIT-CC detects the three-dimensional position of Compton scattering and photoelectric absorption, and thus, the degree of polarization of incoming x rays can be evaluated. We attached the EBIT-CC on the Tokyo Electron Beam Ion Trap (Tokyo-EBIT) in the University of Electro-Communications. An experiment was performed to evaluate its polarimetric capability through an observation
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