An application of a Si/CdTe Compton camera for the polarization measurement of hard x rays from highly charged heavy ions

Y. Tsuzuki, Shin Watanabe, Shimpei Oishi, Nobuyuki Nakamura, Naoki Numadate, Hirokazu Odaka, Yuusuke Uchida, Hiroki Yoneda, Tadayuki Takahashi

Review of Scientific Instruments · 2021

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Source type: Peer-reviewed study
DOI: 10.1063/5.0050826
Catalogue ID: BFmob79ncf-bq2rnz

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