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Peer-reviewed

Before reliable near infrared spectroscopic analysis - the critical sampling proviso. Part 2: Particular requirements for near infrared spectroscopy

Kim H Esbensen; Nawaf Abu-Khalaf

Journal of Near Infrared Spectroscopy · 2022

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Summary

Non-representative sampling of materials, lots and processes intended for NIR analysis is often fraught with hidden contributions to the full Measurement Uncertainty MUtotal = TSE + TAENIR. The Total Sampling Error (TSE) can dominate over the Total Analytical Error TAENIR by factors of 5 to 10 to even 25 times, depending on the degree of material heterogeneity and the specific sampling procedures employed to produce the minuscule aliquot, which is the only material actually analysed. Part 1 presented a brief of all sampling uncertainty elements in the “lot-to-aliquot” pathway, which must be identified and correctly managed (eliminated or reduced maximally), especially the sampling bias, as a prerequisite to achieve fully representative sampling. The key for this is the Theory of Sampling

Source type
Peer-reviewed study
DOI
10.1177/09670335221124611
Catalogue ID
NRmo9rin9c-0tp
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