Event Triggered Wavelet Functional SVR Modeling for In-Situ Measurement of Fermentation Process Components via Near-Infrared Spectroscopy

Yu Yan; Shoulin Hao; Qin Zhang; Tao Liu; Yahui Li; Rui Sun; Shaoyong Men

Cybersecurity and Cyberforensics Conference · 2025

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Source type: Peer-reviewed study
DOI: 10.23919/ccc64809.2025.11179329
Catalogue ID: NRmob6m196-00t

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