Summary
Semiconductor Compton telescope (SCT) is one of the promising technologies in cosmic MeV gamma-ray observation, because of good angular resolution measure thanks to its high energy and positional resolutions. However, it cannot be better than a few degrees because of quantum limitation, known as doppler broadening. With improving sensitivity in MeV astronomy, realization of 10-arcmin-level of angular resolution is becoming more important. Combining a coded-aperture mask imaging to SCT is the simplest measure to obtain this level of angular resolution in MeV astronomy. Since the mask made of heavy metal is a BGD source and contribution from bright sources and CXB limits the statistical significance of the mask decoding, we propose the concept of attaching a coded mask to a narrow-field Si/C
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