Summary
We developed a 2-mm-thick CdTe double-sided strip detector (CdTe-DSD) with a 250 um strip pitch, which has high spatial resolution with a uniform large imaging area of 10 cm$^2$ and high energy resolution with high detection efficiency in tens to hundreds keV. The detector can be employed in a wide variety of fields for quantitative observations of hard X-ray and soft gamma-ray with spectroscopic imaging, for example, space observation, nuclear medicine, and non-destructive elemental analysis. This detector is thicker than the 0.75-mm-thick one previously developed by a factor of $\sim$2.7, thus providing better detection efficiency for hard X-rays and soft gamma rays. The increased thickness could potentially enhance bias-induced polarization if we do not apply sufficient bias and if we d
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