Kouichi Hagino, Hirokazu Odaka, Goro Sato, Tamotsu Sato, Hiromasa Suzuki, Tsunefumi Mizuno, Madoka Kawaharada, M. Ohno, Kazuhiro Nakazawa, Shōgo Kobayashi, Hiroaki Murakami, Katsuma Miyake, Makoto Asai, Tatsumi Koi, G. M. Madejski, Shinya Saito, Dennis H. Wright, Teruaki Enoto, Y. Fukazawa, Katsuhiro Hayashi, J. Kataoka, J. Katsuta, M. Kokubun, Philippe Laurent, F. Lebrun, Olivier Limousin, Daniel Maier, Kazuo Makishima, Kunishiro Mori, Takeshi Nakamori, Toshio Nakano, Hirofumi Noda, Masayuki Ohta, Rie Sato, H. Tajima, H. Takahashi, Tadayuki Takahashi, Shin׳ichiro Takeda, Takaaki Tanaka, Y. Terada, Hideki Uchiyama, Y. Uchiyama, Shin Watanabe, K. Yamaoka, Yoichi Yatsu, Takayuki Yuasa

doi:10.48550/arxiv.2011.10317

Origin of the in-orbit instrumental background of the Hard X-ray Imager onboard Hitomi

Kouichi Hagino, Hirokazu Odaka, Goro Sato, Tamotsu Sato, Hiromasa Suzuki, Tsunefumi Mizuno, Madoka Kawaharada, M. Ohno, Kazuhiro Nakazawa, Shōgo Kobayashi, Hiroaki Murakami, Katsuma Miyake, Makoto Asai, Tatsumi Koi, G. M. Madejski, Shinya Saito, Dennis H. Wright, Teruaki Enoto, Y. Fukazawa, Katsuhiro Hayashi, J. Kataoka, J. Katsuta, M. Kokubun, Philippe Laurent, F. Lebrun, Olivier Limousin, Daniel Maier, Kazuo Makishima, Kunishiro Mori, Takeshi Nakamori, Toshio Nakano, Hirofumi Noda, Masayuki Ohta, Rie Sato, H. Tajima, H. Takahashi, Tadayuki Takahashi, Shin׳ichiro Takeda, Takaaki Tanaka, Y. Terada, Hideki Uchiyama, Y. Uchiyama, Shin Watanabe, K. Yamaoka, Yoichi Yatsu, Takayuki Yuasa

arXiv (Cornell University) · 2020

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Summary

Understanding and reducing the in-orbit instrumental backgrounds are essential to achieving high sensitivity in hard X-ray astronomical observations. The observational data of the Hard X-ray Imager (HXI) on board the Hitomi satellite provides useful information on the background components, owing to its multi-layer configuration with different atomic numbers: the HXI consists of a stack of four layers of Si (Z = 14) detectors and one layer of CdTe (Z = 48, 52) detector surrounded by well-type BGO (Bi4Ge3O12) active shields. Based on the observational data, the backgrounds of top Si layer, the three underlying Si layers, and the CdTe layer are inferred to be dominated by different components, namely, low-energy electrons, albedo neutrons, and proton-induced radioactivation, respectively. Mo

Source type: Peer-reviewed study
DOI: 10.48550/arxiv.2011.10317
Catalogue ID: SNmoic298q-2gp03c

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