Pulse Brain · Growing Health Evidence Index
Peer-reviewed

Silicon strip defects and their impact on electrical performance of readout electronics

A. A. Affolder, V. Fadeyev, Z. Galloway, M. Gignac, J. Gunnell, J. Johnson, N. J. Kang, J. Kaplon, F. Martinez-Mckinney

Journal of Instrumentation · 2021

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Summary

Abstract In preparation for the High Luminosity LHC (HL-LHC) runs, the ATLAS inner detector will be completely replaced with an all silicon Inner Tracker (ITk). Hybrid silicon pixel modules will be used for the innermost tracking layers, and silicon micro-strip detectors will be used the outer layers of the tracker. During the production of the detector, the sensors, readout electronics, and other components will undergo a series of quality control (QC) and quality assurance tests. Defects in the fabrication of the sensors will be flagged early in the manufacturer's and ATLAS QC tests. A study of the influence of sensor defects was performed to assess the characteristics of these defects in completed modules, and whether any defect posed a risk to the operation of the front-end readout ele

Source type
Peer-reviewed study
DOI
10.1088/1748-0221/16/03/p03037
Catalogue ID
SNmokyn4pk-xxo4e5
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