Summary
This paper describes the development of a novel Compton polarimeter (EBIT-CC) comprising pixelated multi-layer silicon and cadmium telluride detectors, attached to the Tokyo Electron Beam Ion Trap. The instrument successfully measured the polarization of hard x rays emitted from highly charged heavy ions with substantially improved accuracy compared to existing methods, achieving absolute uncertainties of 0.02 in polarization degree. The demonstrated capability is sufficient to experimentally probe quantum electrodynamics effects, including Breit interaction calculations, in radiative recombination x rays from highly charged heavy ions.
UK applicability
This is fundamental physics instrumentation research with no direct applicability to UK agriculture, soil science, nutrition, or food systems policy. The work is relevant only to UK-based theoretical and experimental physics communities conducting relativistic quantum electrodynamics research.
Key measures
X-ray polarization degree (absolute uncertainty ±0.02); Compton scattering and photoelectric absorption event detection; three-dimensional position reconstruction; radiative recombination x-ray observations from krypton ions at ~75 keV
Outcomes reported
The study reports successful development and deployment of an Electron Beam Ion Trap Compton Camera (EBIT-CC) achieving polarization degree measurements of hard x rays with an absolute uncertainty of 0.02. The instrument demonstrated sufficient sensitivity to distinguish between theoretical approximations in Breit interaction calculations for highly charged heavy ions.
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