Summary
This technical physics paper describes the development and characterisation of large-area cadmium telluride (CdTe) double-sided strip semiconductor detectors optimised for high-resolution spectroscopic and imaging applications in X-ray and gamma-ray detection. The work addresses engineering challenges in fabricating 2-mm-thick detectors with integrated depth-of-interaction sensing, as suggested by the title and journal focus. The paper reports advances in semiconductor detector technology but has no direct relevance to agricultural systems, soil health, nutrient density assessment, or food and nutrition research.
UK applicability
This specialist instrumentation paper has no direct applicability to UK agricultural practice, soil health monitoring, or food systems research. It may have indirect relevance only if CdTe detectors are subsequently applied to isotope tracing or contaminant detection in soil or food science contexts, which is not addressed here.
Key measures
Detector thickness (2 mm), strip geometry, depth-of-interaction sensing resolution, spectroscopic energy resolution, imaging spatial resolution for X-ray and gamma-ray detection
Outcomes reported
The study reports the engineering and performance characterisation of 2-mm-thick cadmium telluride double-sided strip detectors with depth-of-interaction sensing capability. The work presents technical specifications and experimental validation results for high-resolution X-ray and gamma-ray spectroscopic imaging applications.
Topic tags
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