Summary
This paper describes the design, construction, and experimental validation of the Electron Beam Ion Trap Compton Camera (EBIT-CC), a novel polarimeter employing pixelated multi-layer silicon and cadmium telluride detectors to measure X-ray polarisation from highly charged heavy ions with unprecedented accuracy. Installed on the Tokyo-EBIT facility, the instrument achieved polarisation measurements with an absolute uncertainty of 0.02, substantially improving upon existing technology and enabling exploration of relativistic and quantum electrodynamic effects including the Breit interaction in atomic systems.
UK applicability
This is fundamental atomic physics instrumentation research with no direct applicability to UK farming systems, soil health, or food production. The work may have indirect relevance to UK-based high-energy physics facilities or synchrotron research programmes, but falls outside Vitagri's core thematic scope.
Key measures
Polarisation degree of hard X-rays (∼75 keV); absolute uncertainty in polarisation measurement; three-dimensional position detection of Compton scattering and photoelectric absorption events
Outcomes reported
The study reports successful development and calibration of an Electron Beam Ion Trap Compton Camera (EBIT-CC) for measuring X-ray polarisation from highly charged heavy ions. The instrument achieved an absolute uncertainty of 0.02 in polarisation degree measurement when observing radiative recombination X-rays from krypton ions.
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