Summary
This paper investigates how embedded pitch adapter metal layers in n-substrate silicon microstrip sensors alter signal formation and detection characteristics. Using both experimental beam test data and simulation, the authors demonstrate that pitch adapters modify the internal electric field, slow signal formation on adjacent strips, and introduce pick-up effects that can reduce particle detection efficiency in the adapter region. The findings are corroborated by direct comparison between simulated predictions and observed beam test results.
Key measures
Signal formation timing, electric field distribution, particle detection efficiency, pick-up effects on pitch adapters
Outcomes reported
The study examined how embedded pitch adapters affect signal formation in silicon microstrip sensors through beam tests and simulation. Detection inefficiencies and altered electric field effects were measured in the pitch adapter region.
Topic tags
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